But Lock-up latches are not always help; they can be the cause for congestion issue after scan stitching in designs containing both EDT and LBIST. Lock-up Latch insertion during scan stitching: 1- ...
SoC manufacturers have always endeavored to reduce the feature size through technology and topology. This article refers to a feature size reduction topology and resulting degradation in latch-up ...
一些您可能无法访问的结果已被隐去。
显示无法访问的结果