Therefore, the fault models are different in memories (due to its array structure) than in the standard logic design. Also, during memory tests, apart from fault detection and localization, ...

Memory testing will become more effective when it adds repair features like Built-In Redundancy ... Repair analysis also includes collection of faulty locations available, redundancy analysis, and ...

On January 27, the company announced the launch of a comprehensive Low-Power Double Data Rate 6 (LPDDR6) design and test solution. This solution is designed to support next-generation memory ...