than in the standard logic design. Also, during memory tests, apart from fault detection and localization, self-repair of faulty cells through redundant cells is also implemented. It is also a ...
On January 27, the company announced the launch of a comprehensive Low-Power Double Data Rate 6 (LPDDR6) design and test ...
Memory testing will become more effective when it adds repair features ... and analysis of how memories will access repair logic- increasing design complexity. When we are dealing with SoCs, where ...
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