Analog Integrated Circuits,CMOS Process,Current Reference,Device Model,Factorial Design,Goodness Of Fit,Layout-dependent Effects,Median Test,Parametric Tests,Passive ...

Gate Capacitance,Compact Model,Drain Bias,Drift Region,High Drain,High Voltage,Internal Voltage,Model Parameters,Access Resistance,Accuracy Of Model,Advanced CMOS Technology,Ballistic Transport ...